The aim of this technic is to show, in the same time, the crystalline or amorphous nature of a bulk sample or a powder, and to determine the different crystal phases.

Principle

The principle of XRD is to diffract X-rays on a flat sample or a powder. The diffraction is carried out according to Bragg's Law when there is an organization of the atoms in the matter along crystallographic planes.

Technical data

The diffractometer of ICPEES is a Bruker D8 Advance, working in to the mode, which leaves the sample in the horizontal position.

The X-rays source is a anticathode of cooper giving photons with a wavelength of 1,54.10^-10 m.

There are two detectors : a scintillator and a diodes linear sensor detector called LynxEye.

We also have a temperature controlled chamber to perform XRD measurments under oxidizing or wekly reducing atmospheres, in a temperature range from ambient to 1000°C.

Analysis Conditions

The samples must be bulks or powders. For non-ambient measurments, there is a carrier gas flow through the chamber to avoid the risk of explosion. This gas may be air, oxygen, argon, or a mix of 5 % hydrogen in argon.

Contacts and location

The technical manager of diffractometer is Thierry Dintzer : 03 68 85 27 53. The diffractometer is located in R3, level 1.