Characterization division

Carry out characterisations of materials prepared and/or used at ICPEES using:

• scanning electron microscopy (SEM) or scanning transmission electron microscopy (STEM)
• X-ray microanalysis (EDX)
• X-ray photoelectron spectroscopy (XPS)
• X-ray diffraction (XRD)
• specific surface area measurement (BET) and porometry
• infrared absorption spectroscopy
• rheometry
• thermogravimetric analysis (TGA)
• atomic force microscopy (AFM, PFM or MFM)
• 4-point resistometry
• 3D mechanical profilometry
• optical microscopy

Thierry Dintzer (coordinator)
email: thierry.dintzer[at]unistra.fr
Tel: 03 68 85 27 53
R3N1, BU7

Christophe Mélart
email: christophe.melart[at]unistra.fr
Tel: 03 68 85 27 14
R1N2, BU5

Vasiliki Papaefthymiou
email: papaefthymiou[at]unistra.fr
Tel: 03 68 85 27 60
R3N1

Sécou Sall
email: ssall[at]unistra.fr
Tel: 03 68 85 27 56
R1N2, BU3

Sabine Siegwald
email: sabine.siegwald[at]unistra.fr
Tel: 03 68 85 26 27
Hall de Technologie

Fabrice Vigneron
email: fabrice.vigneron[at]unistra.fr
Tel: 03 68 85 27 58
R5N2, BU5