Installation of the new PHI GENESIS XPS spectrometer at ICPEES

The ICPEES has just welcomed a new PHI Genesis (XPS) Surface Analysis Instrument, installed in the basement of building R3.
This major acquisition strengthens the analytical capabilities of the Surface Analysis Spectroscopy Platform (PSASI), dedicated to the characterization of materials using advanced spectroscopic techniques.

Installation and training period: three weeks
Location: basement of building R3, ICPEES
Scientific manager: Spiros Zafeiratos
Technical manager: Vasiliki Papaefthymiou

Main features:

• Fast and fully automated XPS analysis

• High energy resolution, ideal for detailed investigation of chemical states and complex interfaces

This new instrument will support laboratory projects in the fields of catalysis, functional materials, polymers, and hybrid surfaces, while also opening the platform to new academic and industrial collaborations.

A big thank you to Muhammad Younas and Bruno Abert from PHI Europe, for their patience and availability throughout the installation and training period.